28 May 1999 Compensation for image retention in an amorphous silicon detector
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Because of traps in the photodiodes, amorphous silicon detectors retain charge and release it slowly after exposure. One effect of this property is that after an exposure, a ghost image may appear in subsequent images. This is a particular problem when fluoroscopic imaging follows radiographic exposure. In this paper we propose a method for predicting the magnitude of the ghost image so that it can be eliminated. The method uses linear systems theory to model the time behavior of the signal. Then the model is used to predict the offset as a function of time so that offset correction can be performed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sussan Pourjavid, Sussan Pourjavid, Paul R. Granfors, Paul R. Granfors, "Compensation for image retention in an amorphous silicon detector", Proc. SPIE 3659, Medical Imaging 1999: Physics of Medical Imaging, (28 May 1999); doi: 10.1117/12.349528; https://doi.org/10.1117/12.349528


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