31 May 1999 Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer
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Abstract
A simple procedure is developed for the measurement of the differential quadratic electro-optic coefficient, R33, by two-beam polarization (TBP) interferometry. It is shown that a TBP interferometer can be used for measuring the Kerr coefficient of a thin film with a strong Fabry-Perot effect. The measured values of the differential effective Kerr coefficient, R33 of lead zirconate titanate 52/48 thin film lie inside the interval between -0.5 * 10-18 m2/V2 and +1.7 * 10-18 m2/V2 for the external DC field from -160 kV/cm to 160 kV/cm, in agreement with the known data. The correlation between differential electro-optic coefficients and field-induced birefringence is discussed.
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Vasilii V. Spirin, Mikhail G. Shlyagin, Serguei V. Miridonov, Kwangsoo No, "Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer", Proc. SPIE 3670, Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials, (31 May 1999); doi: 10.1117/12.349722; https://doi.org/10.1117/12.349722
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