Paper
12 July 1999 Domain structure of poled (111) PZT (PbZr0.25Ti0.75O3) films
Christian Erich Zybill, Hussein Boubekeur, Peter Radojkovic, Michael Schwartzkopff, E. Hartmann, Frederick Koch, Gerhard Groos, Bohuslav Rezek, Rainer Bruchhaus, Wolfram Wersing
Author Affiliations +
Abstract
Domain wall sin ferroelectric tetragonal poled PZT films have been observed by surface corrugation effects. Boundaries between adjacent 90 degree domains show a vertical shrinkage on the surface as result of coherency defects and shear strain at the interface between domains. The vertical truncation of the surface amounts to 1.0-1.5 nm. The wall thickness of 90 degree domains has been estimated to approximately 1 nm. STM allows to detect domains after metallization of the surface with a Cr-Ni or Ti film. AFM measurements with grounded samples provide a detailed picture of the unmetallized PZT surface. Single crystalline areas consists of strictly oriented domains of 10-15 nm width. Domains show long-range ordering effects due to stress in the film. A mean value of domain width can also be obtained by SAXS and amounts to 17.5 nm. Exertion of stress result into an increase of domain thickness by approximately 1 percent. Electrical switching of single crystallites as well as optical effects have been demonstrated.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian Erich Zybill, Hussein Boubekeur, Peter Radojkovic, Michael Schwartzkopff, E. Hartmann, Frederick Koch, Gerhard Groos, Bohuslav Rezek, Rainer Bruchhaus, and Wolfram Wersing "Domain structure of poled (111) PZT (PbZr0.25Ti0.75O3) films", Proc. SPIE 3675, Smart Structures and Materials 1999: Smart Materials Technologies, (12 July 1999); https://doi.org/10.1117/12.352816
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Cited by 3 scholarly publications.
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KEYWORDS
Ferroelectric materials

Crystals

Atomic force microscopy

Polarization

Scanning tunneling microscopy

Interfaces

Switching

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