Paper
25 June 1999 Design and development of thin film materials for 157-nm and VUV wavelengths: APSM, binary masking, and optical coatings applications
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Abstract
As optical lithography below 193 nm is explored, materials issues become more challenging. Thin film coatings that are sufficient for use at wavelengths near or above 200 nm are more likely than not to be problematic at 157 nm, 126 nm, or other potential VUV wavelengths. The situation is a concern for optical coatings, masking films, and for resist/substrate reflectivity control. Potential solutions for several film types are presented, which have been deposited and optically characterized for use as attenuated phase shift masking films, binary masking films, and optical coatings for use at 157 nm.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bruce W. Smith, Anatoly Bourov, Lena Zavyalova, and Michael J. Cangemi "Design and development of thin film materials for 157-nm and VUV wavelengths: APSM, binary masking, and optical coatings applications", Proc. SPIE 3676, Emerging Lithographic Technologies III, (25 June 1999); https://doi.org/10.1117/12.351108
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Cited by 8 scholarly publications and 4 patents.
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KEYWORDS
Thin films

Chromium

Dielectrics

Optical coatings

Optical properties

Reflectivity

Silicon

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