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19 July 1999 Characterization measurements of the wideband infrared scene projector resistor array: III
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Abstract
This paper discusses the performance of the Wideband Infrared Scene Projector (WISP) phase III arrays. Characterization measurements including: spectral output, dynamic range capability, apparent temperature, rise time, and fall time, have been accomplished on the WISP-III array at the Kinetic Kill Vehicle Hardware-in-the Loop Simulator facility and the Guided Weapons Evaluation Facility, Eglin AFB, FL.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lawrence E. Jones, Robert Lee Murrer Jr., Robert G. Stockbridge, Virgil G. Timms, and Andrew W. Guertin "Characterization measurements of the wideband infrared scene projector resistor array: III", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352904
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