Developments at the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) facility

Robert Lee Murrer Jr.; Rhoe A. Thompson; Charles F. Coker

doi:10.1117/12.352921

19 July 1999 Developments at the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) facility

Robert Lee Murrer Jr., Rhoe A. Thompson, Charles F. Coker

Proceedings Volume 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV; (1999) https://doi.org/10.1117/12.352921
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

The Ballistic Missile Defense Organization (BMDO) sponsored the development of the Kinetic Kill Vehicle Hardware-in-the- Loop Simulator (KHILS) to provide a comprehensive ground test capability for end game performance evaluation of BMDO interceptor concepts. Since its inception in 1986, the KHILS facility has been on the forefront of HWIL test technology development. This development has culminated in closed-loop testing involving large format resistive element projection arrays, 3D scene rendering systems, and real-time high fidelity phenomenology codes. Each of these components has been integrated into a real-time environment that allows KHILS to perform dynamic closed-loop testing of BMDO interceptor systems or subsystems. Ongoing activities include the integration of multiple resistor arrays into both a cold chamber and flight motion simulator environment, increasing the update speed of existing arrays to 180 Hz, development of newer 200 Hz snapshot resistor arrays, design of next generation 1024 X 1024 resistor arrays, development of a 1000 Hz seeker motion stage, integration of a resistor array into an RF chamber, and development of advanced real-time plume flow-field codes. This paper describes these activities and test results of the major facility components.

Citation Download Citation

Robert Lee Murrer Jr., Rhoe A. Thompson, and Charles F. Coker "Developments at the Kinetic Kill Vehicle Hardware-in-the-Loop Simulator (KHILS) facility", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352921

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