MIRAGE read-in integrated circuit testing results

Theodore R. Hoelter; Blake A. Henry; John H. Graff; Naseem Y. Aziz

doi:10.1117/12.352896

19 July 1999 MIRAGE read-in integrated circuit testing results

Theodore R. Hoelter, Blake A. Henry, John H. Graff, Naseem Y. Aziz

Proceedings Volume 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV; (1999) https://doi.org/10.1117/12.352896
Event: AeroSense '99, 1999, Orlando, FL, United States

Abstract

This paper describes the test results for the MIRAGE read- in-integrated-circuit (RIIC) designed by Indigo Systems Corporation. This RIIC, when mated with suspended membrane, micro-machined resistive elements, forms a highly advanced emitter array. This emitter array is used by Indigo and Santa Barbara Infrared Incorporated in a jointly developed product for infrared scene generation, called MIRAGE. The MIRAGE RIIC is a 512 X 512 pixel design which incorporates a number of features that extend the state of the art for emitter array RIIC devices. These innovations include an all-digital interface for scene data, snapshot image updates (all pixels show the new frame simultaneously), frame rates up to 200 Hz, operating modes that control the device output, power consumption, and diagnostic configuration. Tests measuring operating speed, RIIC functionality and D/A converter performance were completed. At 2.1 X 2.3 cm, this die is also the largest nonstitched device ever made by Indigo's foundry, American Microsystems Incorporated. As with any IC design, die yield is a critical factor that typically scales with the size and complexity. Die yield, and a statistical breakdown of the failures observed will be discussed.

Citation Download Citation

Theodore R. Hoelter, Blake A. Henry, John H. Graff, and Naseem Y. Aziz "MIRAGE read-in integrated circuit testing results", Proc. SPIE 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV, (19 July 1999); https://doi.org/10.1117/12.352896

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