26 July 1999 Theoretical basis and experimental confirmation: why a CMOS imager is superior to a CCD
Author Affiliations +
Abstract
Sub-micron CMOS has already enabled the development of IR focal plane array with ultra-low read noise and high sensitivity for many demanding applications. The successful monolithic integration of silicon photo detector with low- noise pixel-based amplifiers in fine pixel pitch via modern CMOS technology now suggests the imminent obsolescence of CCDs and photographic film for consumer uses. Specifically, we report the achievement of < 20 e- read noise at high data rates and video frame rate,s the confirmation of the fundamental superiority of the CMOS imager for visible imaging, and approximately 2X reduction in kTC noise without invoking classical correlated double sampling techniques. These suggest a strong likelihood reduction in kTC noise without invoking classical correlated double sampling techniques. These suggest a strong likelihood that the CCDs long reign is coming to an end.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lester J. Kozlowski, Lester J. Kozlowski, David L. Standley, David L. Standley, Jiafu Luo, Jiafu Luo, Alfredo Tomasini, Alfredo Tomasini, Anthony M. Gallagher, Anthony M. Gallagher, R. Mann, R. Mann, B. C. Hsieh, B. C. Hsieh, T. Liu, T. Liu, William E. Kleinhans, William E. Kleinhans, } "Theoretical basis and experimental confirmation: why a CMOS imager is superior to a CCD", Proc. SPIE 3698, Infrared Technology and Applications XXV, (26 July 1999); doi: 10.1117/12.354540; https://doi.org/10.1117/12.354540
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT

A 2048 X 64 Tapped Time Delay And Integration Charge...
Proceedings of SPIE (December 06 1988)
Analysis of temporal noise in CMOS APS
Proceedings of SPIE (April 26 1999)
Noise In Charge Injection Device (CID) Image Sensors
Proceedings of SPIE (December 11 1979)
Ultralow-noise infrared focal plane array status
Proceedings of SPIE (October 25 1998)
Intelligent CMOS imaging
Proceedings of SPIE (April 09 1995)

Back to Top