Fault Detection In Non-Destructive Testing (NDT) By An Opto-Electronic Hybrid Processor

Helmut Glunder; Reimar Lenz

doi:10.1117/12.934896

13 December 1983 Fault Detection In Non-Destructive Testing (NDT) By An Opto-Electronic Hybrid Processor

Helmut Glunder, Reimar Lenz

Proceedings Volume 0370, Holographic Data Nondestructive Testing; (1983) https://doi.org/10.1117/12.934896
Event: Holographic Data Nondestructive Testing, 1982, Dubrovnik, Croatia

Abstract

An opto-digital interferogram evaluation system for quality control applications is presented. The system allows the recognition of certain predefined fringe configurations in the input data. Thus the processor is well suited to detect defects of an interferometrically recorded object.

Citation Download Citation

Helmut Glunder and Reimar Lenz "Fault Detection In Non-Destructive Testing (NDT) By An Opto-Electronic Hybrid Processor", Proc. SPIE 0370, Holographic Data Nondestructive Testing, (13 December 1983); https://doi.org/10.1117/12.934896

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