Paper
19 March 1999 Infrared imaging of temperature distribution in a high-temperature x-ray diffraction furnace
Hsin Wang, E. Andrew Payzant
Author Affiliations +
Abstract
High Temperature X-ray Diffraction (HTXRD) is a very powerful tool for studies of reaction kinetics, phase transformations, and lattice thermal expansion of advanced materials. Accurate temperature measurement is a critical part of the technique. Traditionally, thermocouples, thermisters, and optical pyrometers have been used for temperature control and measurement, and temperature could only be measured at a single point. Infrared imaging was utilized in this study to characterize the thermal gradients resulting from various sample and furnace configurations in a commercial strip heater furnace. Furnace configurations include a metallic strip heater, with and without a secondary surround heater, or surround heater alone. Sample configurations include low and high thermal conductivity powders and solids. The IR imaging results have been used to calibrate sample temperatures in the HTXRD furnace.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hsin Wang and E. Andrew Payzant "Infrared imaging of temperature distribution in a high-temperature x-ray diffraction furnace", Proc. SPIE 3700, Thermosense XXI, (19 March 1999); https://doi.org/10.1117/12.342329
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Temperature metrology

Infrared imaging

X-ray diffraction

Calibration

Electrodes

Error analysis

Infrared cameras

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