12 July 1999 Characterization of MWIR thermal imaging systems
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The development and subsequent production of Cincinnati Electronics Mid Wave Infrared thermal imaging systems has provided a significantly diverse set for system characterization. In this paper we describe measurement methodologies, results and modeled comparisons of the Noise Equivalent Temperature Difference and Minimum Resolvable Temperature Difference characterizations for three systems.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mike Davis, Robert L. Smith, Dave Grebe, Dale Kennard, Mike Long, "Characterization of MWIR thermal imaging systems", Proc. SPIE 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, (12 July 1999); doi: 10.1117/12.352973; https://doi.org/10.1117/12.352973

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