12 July 1999 Characterization of MWIR thermal imaging systems
Author Affiliations +
Proceedings Volume 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X; (1999); doi: 10.1117/12.352973
Event: AeroSense '99, 1999, Orlando, FL, United States
Abstract
The development and subsequent production of Cincinnati Electronics Mid Wave Infrared thermal imaging systems has provided a significantly diverse set for system characterization. In this paper we describe measurement methodologies, results and modeled comparisons of the Noise Equivalent Temperature Difference and Minimum Resolvable Temperature Difference characterizations for three systems.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mike Davis, Robert L. Smith, Dave Grebe, Dale Kennard, Mike Long, "Characterization of MWIR thermal imaging systems", Proc. SPIE 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, (12 July 1999); doi: 10.1117/12.352973; https://doi.org/10.1117/12.352973
PROCEEDINGS
14 PAGES


SHARE
KEYWORDS
Imaging systems

Minimum resolvable temperature difference

Black bodies

Systems modeling

Data modeling

Spatial frequencies

Temperature metrology

RELATED CONTENT


Back to Top