12 July 1999 Characterization of MWIR thermal imaging systems
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Abstract
The development and subsequent production of Cincinnati Electronics Mid Wave Infrared thermal imaging systems has provided a significantly diverse set for system characterization. In this paper we describe measurement methodologies, results and modeled comparisons of the Noise Equivalent Temperature Difference and Minimum Resolvable Temperature Difference characterizations for three systems.
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Mike Davis, Robert L. Smith, Dave Grebe, Dale Kennard, Mike Long, "Characterization of MWIR thermal imaging systems", Proc. SPIE 3701, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing X, (12 July 1999); doi: 10.1117/12.352973; https://doi.org/10.1117/12.352973
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