9 March 1999 Optical-electronic pattern recognition system based on image-moment-features adaptive computation
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Abstract
The new class of computer systems is presented, the architecture of which is controlled by parameters of the input images and based on usage of the adaptive moment image features (MIF) statistical analysis. Main types of MIF, as well as opportunity of their formation are described.
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Veacheslav L. Perju, Veacheslav L. Perju, Adrian V. Gurau, Adrian V. Gurau, V. V. Perju, V. V. Perju, "Optical-electronic pattern recognition system based on image-moment-features adaptive computation", Proc. SPIE 3715, Optical Pattern Recognition X, (9 March 1999); doi: 10.1117/12.341308; https://doi.org/10.1117/12.341308
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