8 April 1999 Point contact spectroscopy of ZnS:Mn,Cu-Al thin film cells
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Abstract
A point contact ZnS:Mn,Cu thin film-normal metal (Pt0.9Ir0.1 junctions were investigated. The current and differential resistance versus dc applied voltage were measured. We observed, the dependencies exhibit memory effect. It was found that the effect strongly depends on temperature. It is shown that Pool-Frenkel mechanism of the charge transport describes well the measured I(U) characteristics.
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Bronislaw Susla, Bronislaw Susla, Eugeniusz Chimczak, Eugeniusz Chimczak, Miroslawa Bertrandt-Zytkowiak, Miroslawa Bertrandt-Zytkowiak, Maciej Kaminski, Maciej Kaminski, } "Point contact spectroscopy of ZnS:Mn,Cu-Al thin film cells", Proc. SPIE 3725, International Conference on Solid State Crystals '98: Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, (8 April 1999); doi: 10.1117/12.344741; https://doi.org/10.1117/12.344741
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