4 March 1999 Coherent optical methods of dynamic parameter diagnostics of microwave transistors
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Proceedings Volume 3726, Saratov Fall Meeting '98: Light Scattering Technologies for Mechanics, Biomedicine, and Material Science; (1999) https://doi.org/10.1117/12.341379
Event: Saratov Fall Meeting '98: Light Scattering Technologies for Mechanics, Biomedicine, and Material Science, 1998, Saratov, Russian Federation
Abstract
Coherent optical time, frequency and heterodyne domain methods of dynamic parameters diagnostic of microwave transistors are discussed. Possibilities of optoelectronic and electrooptic station at the probing by picosecond pulses using mode-locked laser are considered. Peculiarities of microwave modulation of injective heterolaser and MESFET dynamic photoresponse are discussed. The determination of microwave transistor gain and noise coefficients using laser heterodyne methods at the probing of the active area drain- source is shown.
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Garif G. Akchurin, Garif G. Akchurin, } "Coherent optical methods of dynamic parameter diagnostics of microwave transistors", Proc. SPIE 3726, Saratov Fall Meeting '98: Light Scattering Technologies for Mechanics, Biomedicine, and Material Science, (4 March 1999); doi: 10.1117/12.341379; https://doi.org/10.1117/12.341379
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