Birefringence dispersion inhomogeneity testing in optical materials by imaging polarimetry

Andrzej L. Bajor

doi:10.1117/12.346830

29 April 1999 Birefringence dispersion inhomogeneity testing in optical materials by imaging polarimetry

Andrzej L. Bajor

Proceedings Volume 3729, Selected Papers from International Conference on Optics and Optoelectronics '98; (1999) https://doi.org/10.1117/12.346830
Event: Selected Papers from the International Conference on Optics and Optoelectronics, 1998, Dehradun, India

Abstract

In many optical applications of anisotropic crystals birefringence dispersion (BD) is at least so important as birefringence spatial inhomogeneity itself. In this work a new technique of 2D mapping of parameters related to BD in plane-parallel wafers of optical materials is reported. A computer-controlled imaging spectro-polarimeter is used for recording the wafers' images for consecutively varying wavelengths. Examples of practical measurements carried out on undoped and Cu-doped LiNbO₃ are presented.

Citation Download Citation

Andrzej L. Bajor "Birefringence dispersion inhomogeneity testing in optical materials by imaging polarimetry", Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); https://doi.org/10.1117/12.346830

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