29 April 1999 Engineering applications of speckle phenomenon
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Proceedings Volume 3729, Selected Papers from International Conference on Optics and Optoelectronics '98; (1999) https://doi.org/10.1117/12.346807
Event: Selected Papers from the International Conference on Optics and Optoelectronics, 1998, Dehradun, India
Abstract
Speckle Phenomenon has been used for the measurement of surface roughness, deformation and shape of the object. Electronic speckle pattern interferometry can deliver the measurement data at the video rate. Some applications of ESPI like defect detection, residual stress measurement etc. are presented.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rajpal S. Sirohi, Rajpal S. Sirohi, } "Engineering applications of speckle phenomenon", Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346807; https://doi.org/10.1117/12.346807
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