29 April 1999 Moire interferometric strain sensor
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Proceedings Volume 3729, Selected Papers from International Conference on Optics and Optoelectronics '98; (1999) https://doi.org/10.1117/12.346814
Event: Selected Papers from the International Conference on Optics and Optoelectronics, 1998, Dehradun, India
Abstract
A new compact system is proposed and instrumentated for directly measuring in-plane strain using a high frequency grating and two Position Sensor Detectors (PSDs). The grating with a frequency of 1200 lines/mm attached on the surface of a specimen is illuminated by a focused laser beam. The spatial resolution for strain measurement, i.e. illuminating area on the specimen is about 0.4 mm. The centroids of diffracted beam spots from the grating is automatically determined with two PSD sensors connected to a personal computer. The shift of diffracted beam spots due to the specimen deformation is then detected. Several measures for improving strain sensitivity are taken. Strain sensitivity of 1 micro-strain can be obtained. The residual strain error is analyzed due to the misalignment of laser and grating. The system can be used for both static and dynamic test.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anand Krishna Asundi, Anand Krishna Asundi, Bing Zhao, Bing Zhao, } "Moire interferometric strain sensor", Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346814; https://doi.org/10.1117/12.346814
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