29 April 1999 Triangular path interferometer for stress analysis
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Proceedings Volume 3729, Selected Papers from International Conference on Optics and Optoelectronics '98; (1999) https://doi.org/10.1117/12.346816
Event: Selected Papers from the International Conference on Optics and Optoelectronics, 1998, Dehradun, India
Abstract
A scheme for combining a common path triangular interferometer with a standard polariscope has been proposed which will enable one to obtain normal photoelastic fringe pattern as well as the first derivative of the stress pattern from the same setup. The results under different conditions of testing are represented along with basic mathematical formulation for the same.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samir Kumar Sarkar, Samir Kumar Sarkar, Rabindra Nath Chakraborty, Rabindra Nath Chakraborty, Amitabha Basuray, Amitabha Basuray, } "Triangular path interferometer for stress analysis", Proc. SPIE 3729, Selected Papers from International Conference on Optics and Optoelectronics '98, (29 April 1999); doi: 10.1117/12.346816; https://doi.org/10.1117/12.346816
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