6 September 1999 SLIOS: a contribution to standard procedures in stray light measurements
Author Affiliations +
Abstract
Light scattering measurements are important tools for characterizing optical surfaces can basically be divided into two main groups: total scatter measurements (TS) and Angle Resolved Scattering (ARS). Since TS measurements are fairly straight forward and widely used, international standardization has formulated an international draft standard on it, ISO/DIS 13696. ARS is a more complex method and not as common as TS measurements. However ARS data in form of the Bi-directional Reflectance Distribution FUnction (BRDF) can be used to predict stray light in Laser and Industrial Optical Systems. Because of increasing importance of this topic the EC is sponsoring a project regarding 'Standard procedures for stray light specification, measurement and testing - SLIOS'. During the project two of the activities are: performing a round robin experiment of measuring BRDF data at 5 different sites including some complementary techniques; compiling of an open access data base of measured BRDF data, measured according to procedures agreed upon between the SLIOS partners and proposed for 'Standard Procedures'. Results of these two activities will be presented.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefan M. B. Baumer, Stefan M. B. Baumer, Angela Duparre, Angela Duparre, Thomas Herrmann, Thomas Herrmann, Uwe Schumann, Uwe Schumann, Kees Smorenburg, Kees Smorenburg, Volker Kirschner, Volker Kirschner, Lars H. Mattsson, Lars H. Mattsson, Teresita B. Quinteros, Teresita B. Quinteros, Richard Berglind, Richard Berglind, Stefan Schippel, Stefan Schippel, } "SLIOS: a contribution to standard procedures in stray light measurements", Proc. SPIE 3739, Optical Fabrication and Testing, (6 September 1999); doi: 10.1117/12.360173; https://doi.org/10.1117/12.360173
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Instrumentation Of A Variable Angle Scatterometer (VAS)
Proceedings of SPIE (April 05 1983)
Stray Light From Diffraction Gratings
Proceedings of SPIE (June 03 1987)
Conference On Optical Scattering Standards
Proceedings of SPIE (September 07 1979)
Proposed Specification For Measuring Optical Scatter
Proceedings of SPIE (September 07 1979)

Back to Top