7 May 1999 Adaptive speckle pattern interferometry
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Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347739
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
In our paper we have analyzed the application possibility of a modified version of speckle pattern interferometry: the adaptive speckle pattern interferometry (ASPI). The peculiarity of this technique is that reference waves are produced by holographically reconstructed virtual images. Using this course an adaptive measuring system can be built. A realization of the ASPI is presented as a measuring device for various measuring tasks. Selected applications are shown from real time holography to comparative displacement measurement.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Janos Kornis, Janos Kornis, Zoltan Fuzessy, Zoltan Fuzessy, Attila Nemeth, Attila Nemeth, } "Adaptive speckle pattern interferometry", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347739; https://doi.org/10.1117/12.347739

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