7 May 1999 Birefringence measurement by scattered light method with a phase-shifting technique
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Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347713
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
This paper describes a modified birefringence measurement using the scattered light method combined with a phase shifting technique. A phase shift between orthogonal linear polarization components is realized by a retardation compensator. The measured distribution has a periodical error, which can be reduced by a band pass filtering of the Fourier spectrum of scattered light distribution. This method enables a birefringence distribution on a light path to be obtained.
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Norihiro Umeda, Norihiro Umeda, Jun Takahashi, Jun Takahashi, Daisuke Iiduka, Daisuke Iiduka, Hiroyuki Kohwa, Hiroyuki Kohwa, } "Birefringence measurement by scattered light method with a phase-shifting technique", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347713; https://doi.org/10.1117/12.347713
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