7 May 1999 Direct measurement of evanescent-wave interference patterns with laser-trapped dielectric and metallic particles
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Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347826
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
Interference patterns of evanescent waves have been recorded with laser-trapped dielectric and metallic particles. It has been demonstrated that the image contrast can be improved with laser-trapped metallic particles. Compared with other methods such as scanning tunnelling optical microscopy and shear-force optical microscopy, imaging with a laser-trapped particle is a simpler approach as no distance control is required. On the other hand, the pseudo effect introduced by the distance between a near-field probe and a sample may be reduced as a particle is trapped on the surface of a sample.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Min Gu, Pu Chun Ke, "Direct measurement of evanescent-wave interference patterns with laser-trapped dielectric and metallic particles", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347826; https://doi.org/10.1117/12.347826
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