Paper
7 May 1999 Nondestructive evaluation of simulated and actual surface defects using a photoacoustic microscope
Haruo Endoh, Yoichiro Hiwatashi, Tsutomu Hoshimiya
Author Affiliations +
Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347768
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
Using the specimens of two types with simulated surface defect and the specimen with actual crack, the detection of the surface defect and crack has been demonstrated by photoacoustic microscope. The surface defect of the first type is a group of mutually parallel two defects. The geometry of the second type is the defects crossing orthogonally each other. The specimen of third type is an actual crack. The PA images are obtained for the specimen with double and crossing defects. Furthermore, the detection of actual surface crack has been performed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haruo Endoh, Yoichiro Hiwatashi, and Tsutomu Hoshimiya "Nondestructive evaluation of simulated and actual surface defects using a photoacoustic microscope", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); https://doi.org/10.1117/12.347768
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Cited by 3 scholarly publications.
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KEYWORDS
Photoacoustic spectroscopy

Microscopes

Nondestructive evaluation

Modulation

Defect detection

Phase shift keying

Aluminum

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