7 May 1999 Scanning near-field optical microscope with a superfluorescent source
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Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347830
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
A superfluorescent source used for scanning near-field optical microscope (SNOM) has been developed in this paper. The superfluorescent source originates from an amplified spontaneous emission (ASE) produced by an Er-doped fiber, with a relatively wide spectrum from 1531 nm to 1537 nm. This kind of superfluorescent fiber probe has relatively high photon flux over an ordinary probe. Different image qualities are obtained by the SNOM system with the superfluorescent source and the laser source respectively. Experimental result shows that the coherent noise of the SNOM image is dramatically reduced with the superfluorescent source.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guoping Zhang, Guoping Zhang, Hai Ming, Hai Ming, Jiangping Xie, Jiangping Xie, } "Scanning near-field optical microscope with a superfluorescent source", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); doi: 10.1117/12.347830; https://doi.org/10.1117/12.347830
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