13 August 1999 Application of wavelet filters for feature extraction in interferometric fringe patterns
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Proceedings Volume 3744, Interferometry '99: Techniques and Technologies; (1999) https://doi.org/10.1117/12.357722
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland
Abstract
The fast and reliable localization and classification of fault indicating fringe patterns in interferometric images is a major task in holographic non-destructive testing. For the purpose of feature extraction from gray value images, wavelet transformation has proved to be a suitable tool. In contrast to the Fourier transformation the local feature information will be preserved and furthermore the applied transforming wavelet can be adapted--under certain constraints--to the given problem.
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Daniel Kayser, Wolfgang Osten, Sven Krueger, Guenther K.G. Wernicke, "Application of wavelet filters for feature extraction in interferometric fringe patterns", Proc. SPIE 3744, Interferometry '99: Techniques and Technologies, (13 August 1999); doi: 10.1117/12.357722; https://doi.org/10.1117/12.357722
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