17 August 1999 Compact shearography system for the measurement of 3D deformation
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Proceedings Volume 3745, Interferometry '99: Applications; (1999) https://doi.org/10.1117/12.357771
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland
In this manuscript we present the development of an integrated shearography system that is able to measure the 3D deformation of an object surface. In order to determine all six displacement derivatives that may contribute to shearography results, six measurements with three different sensitivity directions and two shear directions have to be performed. The realized system is able to perform this measurement sequence in an automated way.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephan Waldner, Stefan Brem, "Compact shearography system for the measurement of 3D deformation", Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); doi: 10.1117/12.357771; https://doi.org/10.1117/12.357771

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