17 August 1999 Speckle interferometry: optoelectronic developments and applications
Author Affiliations +
Proceedings Volume 3745, Interferometry '99: Applications; (1999) https://doi.org/10.1117/12.357769
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland
Since the initial concept of speckle interferometry was published more than 30 years ago the subject has matured to the point where it is now an engineering tool used in a wide range of applications with instrumentation available from a number of companies. The development of the technique to this level has been accomplished by making use of parallel developments in a range of technological areas. These are the laser, the PC, and the CCD camera. More recently the incorporation of optical fiber technology has also had a major impact. This paper reviews recent developments in the optoelectronic technology used in speckle interferometry instrumentation and the use made of it in a range of application areas.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ralph P. Tatam, Ralph P. Tatam, } "Speckle interferometry: optoelectronic developments and applications", Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); doi: 10.1117/12.357769; https://doi.org/10.1117/12.357769

Back to Top