New Fourier transform profilometry based on modulation measurement

Xianyu Su; Likun Su; Wansong Li

doi:10.1117/12.354824

19 July 1999 New Fourier transform profilometry based on modulation measurement

Xianyu Su, Likun Su, Wansong Li

Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354824
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States

Abstract

This article propose a new Fourier transform profilometry based on modulation measurement. We briefly call it FTP based on MM. Its main advantage is that it can measure the surface of a complex object in the same direction of projecting light, so it has no the difficulties due to shadow and spatial discontinuity that exist in conventional FTP and also PMP methods. In the paper, we give the principle of the method, the set-up of measurement system, and some primary experimental results. The results proved that this method is a promising method for acquiring 3D data of complex object.

Citation Download Citation

Xianyu Su, Likun Su, and Wansong Li "New Fourier transform profilometry based on modulation measurement", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354824

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