Paper
19 July 1999 Retrace error for the measurement of a long-radius optic
Author Affiliations +
Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999) https://doi.org/10.1117/12.354906
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
The error caused by nonzero fringe pattern in a phase shifting interferometer is `harmful' to testing a long radius optic. In this paper, with the help of a concept of retrace error the error is analyzed through the combination of experiments with simulated calculations, and more sensitive elements are found in system alignment, so that the effect of the misalignment of optical elements on the retrace error is reduced to minimum.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sen Han and Erik Novak "Retrace error for the measurement of a long-radius optic", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); https://doi.org/10.1117/12.354906
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Cited by 3 scholarly publications.
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KEYWORDS
Error analysis

Fringe analysis

Collimators

Photovoltaics

Interferometers

Monochromatic aberrations

Optical components

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