19 July 1999 Scanning near-field optical microscopy: local probes and enhanced electromagnetic fields
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Proceedings Volume 3749, 18th Congress of the International Commission for Optics; (1999); doi: 10.1117/12.354851
Event: ICO XVIII 18th Congress of the International Commission for Optics, 1999, San Francisco, CA, United States
Abstract
Enhanced electromagnetic fields are investigated, both theoretically and experimentally, on two model systems using high spatial resolution. Strong field enhancements at the apex of a tungsten tip illuminated by an external light source are studied as a function of the incident polarization. The surface of percolating random metal- dielectric films consist of several spectral resonances, which have been calculated and are observed here in near field with 10 nm lateral resolution.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. Aigouy, Albert Claude Boccara, S. Ducourtieux, S. Gresillon, Jean-Claude Rivoal, Haim Cory, Patrice Gadenne, Vladimir M. Shalaev, "Scanning near-field optical microscopy: local probes and enhanced electromagnetic fields", Proc. SPIE 3749, 18th Congress of the International Commission for Optics, (19 July 1999); doi: 10.1117/12.354851; https://doi.org/10.1117/12.354851
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KEYWORDS
Near field scanning optical microscopy

Near field optics

Electromagnetism

Dielectric polarization

Metals

Dielectrics

Optical microscopy

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