PROCEEDINGS VOLUME 3754
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 18-23 JULY 1999
Polarization: Measurement, Analysis, and Remote Sensing II
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
18-23 July 1999
Denver, CO, United States
Polarization Theory, Mathematics, and Modeling
Proc. SPIE 3754, Eigenvalue parameters for surface roughness studies, 0000 (25 October 1999); https://doi.org/10.1117/12.366317
Proc. SPIE 3754, Depolarization, 0000 (25 October 1999); https://doi.org/10.1117/12.366327
Proc. SPIE 3754, Nonideal polarizers, 0000 (25 October 1999); https://doi.org/10.1117/12.366342
Proc. SPIE 3754, Entropy of scattered field correlations by chiral spheroids, 0000 (25 October 1999); https://doi.org/10.1117/12.366350
Proc. SPIE 3754, Stochastic aspects of the unified polarization calculus, 0000 (25 October 1999); https://doi.org/10.1117/12.366358
Proc. SPIE 3754, Beam wander considerations in imaging polarimetry, 0000 (25 October 1999); https://doi.org/10.1117/12.366359
Proc. SPIE 3754, Measurement of polarization fluctuations in polydispersions of small spheroids, 0000 (25 October 1999); https://doi.org/10.1117/12.366360
Proc. SPIE 3754, General Lorentz transformation and its application to deriving and evaluating the Mueller matrices of polarization optics, 0000 (25 October 1999); https://doi.org/10.1117/12.366361
Proc. SPIE 3754, Thermal emission polarization, 0000 (25 October 1999); https://doi.org/10.1117/12.366318
Polarization Measurements, Materials, and Instruments I
Proc. SPIE 3754, Correlation of Fresnel's interface reflection coefficients of external and internal reflection at the same angle of incidence for dielectric-dielectric interfaces, 0000 (25 October 1999); https://doi.org/10.1117/12.366319
Proc. SPIE 3754, Infrared polarimetry using attenuated total reflection, 0000 (25 October 1999); https://doi.org/10.1117/12.366320
Proc. SPIE 3754, Imaging polarimetry in scene element discrimination, 0000 (25 October 1999); https://doi.org/10.1117/12.366321
Proc. SPIE 3754, Measurements of midwave and longwave infrared polarization from water, 0000 (25 October 1999); https://doi.org/10.1117/12.366322
Proc. SPIE 3754, Polarimetric characterization of Spectralon, 0000 (25 October 1999); https://doi.org/10.1117/12.366323
Proc. SPIE 3754, Multispectral infrared Stokes imaging polarimeter, 0000 (25 October 1999); https://doi.org/10.1117/12.366324
Proc. SPIE 3754, Return-path polarimeter for two-dimensional birefringence distribution measurement, 0000 (25 October 1999); https://doi.org/10.1117/12.366325
Polarization Measurements, Materials, and Instruments II
Proc. SPIE 3754, Polarization Michelson interferometer: principles and applications, 0000 (25 October 1999); https://doi.org/10.1117/12.366326
Proc. SPIE 3754, Compact solid polarization phase-shifting Mach-Zehnder interferometer, 0000 (25 October 1999); https://doi.org/10.1117/12.366328
Proc. SPIE 3754, Research Scanning Polarimeter: calibration and ground-based measurements, 0000 (25 October 1999); https://doi.org/10.1117/12.366329
Proc. SPIE 3754, Industrial applications of a high-sensitivity linear birefringence measurement system, 0000 (25 October 1999); https://doi.org/10.1117/12.366330
Polarization Measurements, Materials, and Instruments III
Proc. SPIE 3754, Dark-target retroreflection increase, 0000 (25 October 1999); https://doi.org/10.1117/12.366331
Proc. SPIE 3754, Relative variation of stress-optic coefficient with wavelength in fused silica and calcium fluoride, 0000 (25 October 1999); https://doi.org/10.1117/12.366332
Proc. SPIE 3754, Computed-tomography imaging spectropolarimeter (CTISP): instrument concept, calibration, and results, 0000 (25 October 1999); https://doi.org/10.1117/12.366333
Proc. SPIE 3754, Infrared parallel-slab division-of-amplitude photopolarimeter, 0000 (25 October 1999); https://doi.org/10.1117/12.366334
Proc. SPIE 3754, Diffractive-optical-element-based photopolarimeter, 0000 (25 October 1999); https://doi.org/10.1117/12.366335
Proc. SPIE 3754, Comparison of visible and infrared backscattering Mueller matrices from roughened aluminum surfaces, 0000 (25 October 1999); https://doi.org/10.1117/12.366336
Proc. SPIE 3754, Field-of-view analysis of liquid crystal polymer polarizing elements, 0000 (25 October 1999); https://doi.org/10.1117/12.366337
Proc. SPIE 3754, FT-IR-based ellipsometer using high-quality Brewster-angle polarizers, 0000 (25 October 1999); https://doi.org/10.1117/12.366338
Polarization in Remote Sensing
Proc. SPIE 3754, Calibration of the Hyperspectral Imaging Polarimeter, 0000 (25 October 1999); https://doi.org/10.1117/12.366339
Proc. SPIE 3754, Interaction between polarization and response vs. scan angle in the calibration of imaging radiometers, 0000 (25 October 1999); https://doi.org/10.1117/12.366340
Proc. SPIE 3754, Modeling of polarized light scattering in cirrus clouds: validation with in-situ measurements and ADEOS-POLDER reflectance observations, 0000 (25 October 1999); https://doi.org/10.1117/12.366341
Proc. SPIE 3754, Anomalous inversion of polarization of icy satellites and Saturn rings: superdiamagnetic model, 0000 (25 October 1999); https://doi.org/10.1117/12.366343
Polarization Devices
Proc. SPIE 3754, Design and analysis of a beam splitter for the equipartition of infrared input power, 0000 (25 October 1999); https://doi.org/10.1117/12.366344
Proc. SPIE 3754, Arbitrary-to-arbitrary polarization controller using nematic liquid crystals, 0000 (25 October 1999); https://doi.org/10.1117/12.366345
Poster Session
Proc. SPIE 3754, Jones matrix analysis of optical path in virtual coordinate measurement by laser tracking, 0000 (25 October 1999); https://doi.org/10.1117/12.366346
Proc. SPIE 3754, Polarization effects on image quality of optical systems with high numerical apertures, 0000 (25 October 1999); https://doi.org/10.1117/12.366347
Proc. SPIE 3754, Mueller matrix analysis for some classes of objects: number of independent parameters, 0000 (25 October 1999); https://doi.org/10.1117/12.366348
Proc. SPIE 3754, Calibration of the multispectral polarimeter and its measurements of atmospheric aerosols, 0000 (25 October 1999); https://doi.org/10.1117/12.366349
Proc. SPIE 3754, Global aerosol distribution based on multidirectional data given by POLDER, 0000 (25 October 1999); https://doi.org/10.1117/12.366351
Proc. SPIE 3754, Analysis of four-port optical fiber ring resonator with 3x3 fused taper bow-tie optical fiber coupler, 0000 (25 October 1999); https://doi.org/10.1117/12.366352
Proc. SPIE 3754, Depolarization ratio of zenith scattered radiation and measured NO2 slant columns, 0000 (25 October 1999); https://doi.org/10.1117/12.366353
Proc. SPIE 3754, Improving the polarization correction algorithm of GOME (Global Ozone Monitoring Experiment), 0000 (25 October 1999); https://doi.org/10.1117/12.366354
Polarization Measurements, Materials, and Instruments II
Proc. SPIE 3754, Diffractive optical element for Stokes vector measurement with a focal plane array, 0000 (25 October 1999); https://doi.org/10.1117/12.366355
Proc. SPIE 3754, Performance limitations of a four-channel polarimeter in the presence of detection noise, 0000 (25 October 1999); https://doi.org/10.1117/12.366356
Polarization Measurements, Materials, and Instruments I
Proc. SPIE 3754, Calibration procedures for a two-modular generalized ellipsometer, 0000 (25 October 1999); https://doi.org/10.1117/12.366357
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