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25 October 1999 Polarimetric characterization of Spectralon
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Abstract
A polarimetric characterization of the reflective standard material Spectralon is presented. Samples of Spectralon with reflectances of 2 percent, 50 percent, 75 percent and 99 percent were examined. The characterization was accomplished using the Air Force Research Laboratory's spectropolarimeter in reflection mode. Data are presented for the spectral region .65 to 1.0 micrometers. Polarizance was measured for the four Spectralon samples at eight input beam incidence angles. All observations were made from normal to the Spectralon. It was found that as the incidence beam angle increases, the polarizance increases; and as the reflectance of the samples decreases, the polarizance increases.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis H. Goldstein, David B. Chenault, and J. Larry Pezzaniti "Polarimetric characterization of Spectralon", Proc. SPIE 3754, Polarization: Measurement, Analysis, and Remote Sensing II, (25 October 1999); https://doi.org/10.1117/12.366323
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