UV detective quantum efficiency measurements

Charles L. Joseph

doi:10.1117/12.371088

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25 November 1999 UV detective quantum efficiency measurements

Charles L. Joseph

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Proceedings Volume 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III; (1999) https://doi.org/10.1117/12.371088
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We have been testing the vacuum ultraviolet (UV) response of several types of detectors, supporting investigators developing photodiodes made of GaN, near UV photocathodes, and Electron-Bombarded CCDs (EBCCDs). We are currently supporting 4 independent research groups developing GaN most of which have produced devices with significant sensitivity down to 1200 Angstroms. Over the past year, we have also tested bare CCDs with coatings to enhance ultraviolet response. Detectors based on microchannel plate (MCP) have been used extensively for a wide variety of NASA mission and continue to be the standard to beat. Two particularly promising detector technologies are (1) EBCCDs which offer an immediate factor of 3 - 4 improvement in sensitivity and (2) devices made of GaN or GaAlN which may eventually offer factors of 6 - 8 increased sensitivity, both compared to MCPs for wavelengths between 1200 to 3000 Angstroms. We present latest results and plans to expand our vacuum UV testing.

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Charles L. Joseph "UV detective quantum efficiency measurements", Proc. SPIE 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, (25 November 1999); https://doi.org/10.1117/12.371088

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