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Abstract
We have been testing the vacuum ultraviolet (UV) response of several types of detectors, supporting investigators developing photodiodes made of GaN, near UV photocathodes, and Electron-Bombarded CCDs (EBCCDs). We are currently supporting 4 independent research groups developing GaN most of which have produced devices with significant sensitivity down to 1200 Angstroms. Over the past year, we have also tested bare CCDs with coatings to enhance ultraviolet response. Detectors based on microchannel plate (MCP) have been used extensively for a wide variety of NASA mission and continue to be the standard to beat. Two particularly promising detector technologies are (1) EBCCDs which offer an immediate factor of 3 - 4 improvement in sensitivity and (2) devices made of GaN or GaAlN which may eventually offer factors of 6 - 8 increased sensitivity, both compared to MCPs for wavelengths between 1200 to 3000 Angstroms. We present latest results and plans to expand our vacuum UV testing.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Charles L. Joseph "UV detective quantum efficiency measurements", Proc. SPIE 3764, Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III, (25 November 1999); https://doi.org/10.1117/12.371088
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