22 October 1999 Technology development for the Constellation-X hard-x-ray telescope
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Abstract
In addition to high resolving power in the traditional x-ray band, the Constellation X-ray scientific goals require broad bandpass, with response extending to E >= 40 keV. To achieve this objective, Constellation-X will incorporate a hard x-ray telescope (HXT) based on depth graded multilayer- coated grazing incidence optics and position-sensitive solid state detectors. This paper describes the HXT performance requires, provides an overview of the HXT optics and detector technology development efforts, and present example designs.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fiona A. Harrison, Walter R. Cook, Finn Erland Christensen, Oberto Citterio, William W. Craig, Neil A. Gehrels, Paul Gorenstein, Jonathan E. Grindlay, Charles J. Hailey, Richard A. Kroeger, Hideyo Kunieda, Giovanni Pareschi, Ann M. Parsons, Robert Petre, Suzanne E. Romaine, Brian D. Ramsey, Jack Tueller, Melville P. Ulmer, Martin C. Weisskopf, David L. Windt, "Technology development for the Constellation-X hard-x-ray telescope", Proc. SPIE 3765, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X, (22 October 1999); doi: 10.1117/12.366492; http://dx.doi.org/10.1117/12.366492
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KEYWORDS
Sensors

Mirrors

Hard x-rays

Glasses

Nickel

Reflectivity

X-ray optics

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