New developments in attenuation and phase-contrast microtomography using synchrotron radiation with low and high photon energies

Felix Beckmann; Ulrich Bonse; Theodor Biermann

doi:10.1117/12.363719

22 September 1999 New developments in attenuation and phase-contrast microtomography using synchrotron radiation with low and high photon energies

Felix Beckmann, Ulrich Bonse, Theodor Biermann

Author Affiliations +

Proceedings Volume 3772, Developments in X-Ray Tomography II; (1999) https://doi.org/10.1117/12.363719
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Microtomography using synchrotron radiation is widely used in fields of e.g. medicine, biology and material science. Using attenuation contrast at photon energies in the range of 8 to 25 keV and phase contrast at photon energies of 12 keV, 20 keV and 24 keV the method of microtomography is applied to a large number of samples. A comparison of the two different contrast mechanism is presented. Feasibility, advantage and limits of these methods are shown in theory and by experiment. New developments in high-energy microtomography using synchrotron radiation in the energy range of 60 to 100 keV are described. Using attenuation contrast, several samples are investigated. For the investigation of larger specimens with diameters on the order of 1 - 2 cm, the use of a new (mu) CT-technique based on scanning a 2-dim. X-ray detector is demonstrated. At 70 keV photon energy an X-ray LLL-interferometer is tested and used to measure phase projections. For the first time, phase- contrast microtomography could be applied to weakly and normally absorbing material at a high photon energy.

Citation Download Citation

Felix Beckmann, Ulrich Bonse, and Theodor Biermann "New developments in attenuation and phase-contrast microtomography using synchrotron radiation with low and high photon energies", Proc. SPIE 3772, Developments in X-Ray Tomography II, (22 September 1999); https://doi.org/10.1117/12.363719

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available