16 November 1999 Characteristics of the thin crystal spectrometer
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Abstract
We report the characteristics of 'the thin crystal spectrometer,' which is a new technique for a x-ray spectrometer using a thin crystal. The reflection by a thin crystal in the 'Laue' geometry has a diffraction pattern with a finite width. The reflection angle does not need to be the same to the incident angle. The crystal structure along to the crystal plane makes the interference of the reflected x rays and the reflection angle becomes a function of an x-ray wave length. Therefore, the expected energy resolution of this type of the spectrometer is comparable with a usual Bragg crystal, whereas this new spectrometer can have a certain energy band. We report a simple experiment demonstrating this idea, where we show the energy resolution of (E/(Delta) E greater than 2000) and the energy band of ((Delta) E greater than 6 eV). The applications for a focusing optics are briefly presented.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shunji Kitamoto, Shunji Kitamoto, Hideki Ogata, Hideki Ogata, Takako Horikawa, Takako Horikawa, } "Characteristics of the thin crystal spectrometer", Proc. SPIE 3773, X-Ray Optics Design, Performance, and Applications, (16 November 1999); doi: 10.1117/12.370092; https://doi.org/10.1117/12.370092
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