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6 October 1999 Position-sensitive ionization chamber for diffraction studies at synchrotron sources
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Abstract
A position-sensitive ionization chamber has been developed with backgammon-type-segmented electrodes. This novel detector possesses a linear range of 8 mm for determining the incident position of the X-ray beam incoming. The position resolution was found to be better than 10 micrometers , probably close the sub-micrometer region. Owing to its high spatial resolution, the position-sensitive ionization chamber was able to commit that the gradual decrease observed in the X-ray beam intensity at the BL44B2 of the SPring-8 facility was mainly due to the spatial variation of the X-ray beam position in time. The present work also confirmed the applicability of the novel detector to the feedback correction system for the beam stabilization.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazumichi Sato, Hidenori Toyokawa, Yoshiki Kohmura, Tetsuya Ishikawa, and Masayo Suzuki "Position-sensitive ionization chamber for diffraction studies at synchrotron sources", Proc. SPIE 3774, Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, (6 October 1999); https://doi.org/10.1117/12.367117
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