PROCEEDINGS VOLUME 3784
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 18-23 JULY 1999
Rough Surface Scattering and Contamination
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
18-23 July 1999
Denver, CO, United States
Spacecraft Contamination Control I
Proc. SPIE 3784, NASA's Space Environments and Effects (SEE) program: contamination engineering technology development, 0000 (25 October 1999); https://doi.org/10.1117/12.366688
Proc. SPIE 3784, Satellite contamination and materials outgassing effects databases, 0000 (25 October 1999); https://doi.org/10.1117/12.366696
Proc. SPIE 3784, Predicting temperature increases on the GOES imager and sounder radiant coolers, 0000 (25 October 1999); https://doi.org/10.1117/12.366704
Proc. SPIE 3784, Application of general sticking coefficient models to spacecraft contamination analysis, 0000 (25 October 1999); https://doi.org/10.1117/12.366714
Proc. SPIE 3784, Preventing molecular and particulate infiltration in a confined volume, 0000 (25 October 1999); https://doi.org/10.1117/12.366723
Proc. SPIE 3784, Spray cleaning with hydrofluorocarbon solutions, 0000 (25 October 1999); https://doi.org/10.1117/12.366724
Spacecraft Contamination Control II
Proc. SPIE 3784, Consequences of atomic oxygen interaction with silicone and silicone contamination on surfaces in low earth orbit, 0000 (25 October 1999); https://doi.org/10.1117/12.366725
Proc. SPIE 3784, Optical Properties Monitor (OPM) in-situ experiment flown on the Mir station, 0000 (25 October 1999); https://doi.org/10.1117/12.366726
Monitoring and Measurement Techniques
Proc. SPIE 3784, Quartz crystal particle microbalance (QCPM), 0000 (25 October 1999); https://doi.org/10.1117/12.366689
Proc. SPIE 3784, Sticky quartz crystal microbalance as a particle monitor, 0000 (25 October 1999); https://doi.org/10.1117/12.366690
Proc. SPIE 3784, Tests of the sensitivity and mass range of a 50-MHz quartz crystal microbalance (QCM), 0000 (25 October 1999); https://doi.org/10.1117/12.366691
Proc. SPIE 3784, Reflectivity of black-chromium coating at a wavelength of 121.6 nm, 0000 (25 October 1999); https://doi.org/10.1117/12.366692
Surface Roughness: Instrument and Application
Proc. SPIE 3784, Characterization of surfaces using neural pattern recognition methods based on BRDF and AFM measurements, 0000 (25 October 1999); https://doi.org/10.1117/12.366693
Proc. SPIE 3784, Optical surface profilometry in China, 0000 (25 October 1999); https://doi.org/10.1117/12.366694
Proc. SPIE 3784, In-process roughness characterization of specularly reflecting surfaces using doubly scattered light, 0000 (25 October 1999); https://doi.org/10.1117/12.366695
Proc. SPIE 3784, Derivation of BRDF data from smooth surface topography of large AFM scans: investigation of the influences of surface figures and AFM artifacts, 0000 (25 October 1999); https://doi.org/10.1117/12.366697
Proc. SPIE 3784, Analysis of the surface of human skin, 0000 (25 October 1999); https://doi.org/10.1117/12.366698
Poster Session
Proc. SPIE 3784, Three-dimensional topography measurement with triangular beam scanning technique, 0000 (25 October 1999); https://doi.org/10.1117/12.366699
Proc. SPIE 3784, Noncontact high-precision surface 3D profiler, 0000 (25 October 1999); https://doi.org/10.1117/12.366700
Scattering Theory and Analysis
Proc. SPIE 3784, One- and two-dimensionally rough-surface radar backscatter cross section based on a stationary two-scale full-wave approach, 0000 (25 October 1999); https://doi.org/10.1117/12.366701
Proc. SPIE 3784, Tilt-invariant approximation for the admittance operator in the rough-surface scattering theory, 0000 (25 October 1999); https://doi.org/10.1117/12.366702
Proc. SPIE 3784, Small slope approximation method: higher-order contributions for scattering from conducting 3D surfaces, 0000 (25 October 1999); https://doi.org/10.1117/12.366703
Proc. SPIE 3784, Angular intensity correlation functions C^(1) and C^(10) for the scattering of S-polarized light from a 1D randomly rough dielectric surface, 0000 (25 October 1999); https://doi.org/10.1117/12.366705
Proc. SPIE 3784, Inverse relationship between surface brightness and polarization, 0000 (25 October 1999); https://doi.org/10.1117/12.366706
Proc. SPIE 3784, Modification of the Maxwell-Beard bidirectional reflectance distribution function, 0000 (25 October 1999); https://doi.org/10.1117/12.366707
Proc. SPIE 3784, Coherent and incoherent scattering from rough surfaces: influence of the angle of incidence, 0000 (25 October 1999); https://doi.org/10.1117/12.366708
Speckle Correlation and Scattering Measurement
Proc. SPIE 3784, Bidirectional reflectance from pigmented coatings, 0000 (25 October 1999); https://doi.org/10.1117/12.366709
Proc. SPIE 3784, Amplified backscattering from a rough surface through dye-doped polymer, 0000 (25 October 1999); https://doi.org/10.1117/12.366710
Proc. SPIE 3784, Dynamic behavior of speckles from rough surface scattering, 0000 (25 October 1999); https://doi.org/10.1117/12.366711
Proc. SPIE 3784, Polarization of light scattered by spheres on a dielectric film, 0000 (25 October 1999); https://doi.org/10.1117/12.366712
Proc. SPIE 3784, Multidetector hemispherical polarized optical scattering instrument, 0000 (25 October 1999); https://doi.org/10.1117/12.366713
Proc. SPIE 3784, Surface etch-front morphologies using in-plane light scattering, 0000 (25 October 1999); https://doi.org/10.1117/12.366715
Proc. SPIE 3784, Symmetry of speckle correlation around the backscattering directions in the double passage configurations, 0000 (25 October 1999); https://doi.org/10.1117/12.366716
Proc. SPIE 3784, Use of Fresnel diffraction for the measurement of rotational symmetrical workpieces, 0000 (25 October 1999); https://doi.org/10.1117/12.366717
Proc. SPIE 3784, High-temperature attempts using real-time two-color laser speckle-shift strain-measurement system, 0000 (25 October 1999); https://doi.org/10.1117/12.366718
Poster Session
Proc. SPIE 3784, Application of surface-enhanced Raman scattering spectroscopy to the study of insect virus virion, 0000 (25 October 1999); https://doi.org/10.1117/12.366719
Proc. SPIE 3784, Differential intensity detection of surface defect scattering, 0000 (25 October 1999); https://doi.org/10.1117/12.366720
Proc. SPIE 3784, Application of forward-angle light scattering to measured flocculation point of asphaltenes and evaluation of flocks dimensions, 0000 (25 October 1999); https://doi.org/10.1117/12.366721
Proc. SPIE 3784, Spectroscopic studies of asphaltenes, 0000 (25 October 1999); https://doi.org/10.1117/12.366722
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