25 October 1999 Optical surface profilometry in China
Author Affiliations +
This article describes briefly the optical surface profileometry in China, including several result of its theory research, optical profiler development and some problems using the optical profiler.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Deyan Xu, Weixing Shen, "Optical surface profilometry in China", Proc. SPIE 3784, Rough Surface Scattering and Contamination, (25 October 1999); doi: 10.1117/12.366694; https://doi.org/10.1117/12.366694


Research of annular polishing asymmetric ZnS plane window
Proceedings of SPIE (October 28 2016)
The Shack Interferometer
Proceedings of SPIE (November 21 1977)
Phase correction in measurement of gauge blocks using a new...
Proceedings of SPIE (September 30 1998)
Interferogram Analysis For Space Optics
Proceedings of SPIE (September 27 1979)
Interferometry And Quality Testing Of Optical Systems
Proceedings of SPIE (April 03 1989)

Back to Top