Paper
28 June 1999 Method and automatic complete set for nondestructive tensor component and loss measurement crystal materials for infrared and optical engineering
Oleg M. Lazaryev, A. V. Strizhachenko
Author Affiliations +
Abstract
This work is the continuation of the whole series works, dedicated to the investigation of the resonant phenomena in various kind waveguide junctions and expansions. The development requirements of radar and SHF technique cause the wide utilization of the expansions and junctions: as antenna's paths system, wave modes changers and switches, high-Q resonators, measurement devices, frequency band- splitting devices (SHF-filters, satellite communication and TV system multiplexers) and etc. But the anisotropic dielectrics electrical characteristics measurements is of important interest. High quality materials that using in present time (as SHF-filter elements; high-Q resonators and etc.) are the anisotropic crystals. So, the waveguide junctions with anisotropic loading investigation problem is actual.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oleg M. Lazaryev and A. V. Strizhachenko "Method and automatic complete set for nondestructive tensor component and loss measurement crystal materials for infrared and optical engineering", Proc. SPIE 3793, Operational Characteristics and Crystal Growth of Nonlinear Optical Materials, (28 June 1999); https://doi.org/10.1117/12.351427
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Waveguides

Crystals

Dielectrics

Nondestructive evaluation

Infrared materials

Infrared radiation

Optical engineering

RELATED CONTENT

Infrared photonic bandgap materials and structures
Proceedings of SPIE (February 28 2006)
Hollow plastic waveguides for sensor applications
Proceedings of SPIE (March 01 2001)
Crystalline Infrared Fibers
Proceedings of SPIE (July 28 1981)
Distributed Feedback Phenomena At 10.6µm
Proceedings of SPIE (August 24 1987)

Back to Top