Paper
11 October 1999 Measurement of the X(2) distribution in poled nonlinear optical polymer films
Robert Blum, Kersten Pfeifer, Gerrit Schoer, Andrej Ivankov, Manfred Eich
Author Affiliations +
Abstract
We present a method for analyzing the homogeneity of the (chi) (2) distribution in poled nonlinear optical polymer films. The second order nonlinear coefficient in these polymers is commonly induced by electric field poling methods which can lead to a (chi) (2) distribution with poor spatial homogeneity. In this paper, we analyze the (chi) (2) distribution using scanning Kelvin microscopy. This allows us to detect the height and the direction of the induced polarization through the probing of the counter charges that are present on the polymer surface. We compare the response to that obtained from the scanning second harmonic microscopy (SSHM) method, in which the direction of the orientation, and thus the phase of (chi) (2), can not be seen. We also propose a method to measure the (chi) $_(2)) distribution in 3D by analyzing the SSHM images obtained at various wavelengths.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert Blum, Kersten Pfeifer, Gerrit Schoer, Andrej Ivankov, and Manfred Eich "Measurement of the X(2) distribution in poled nonlinear optical polymer films", Proc. SPIE 3796, Organic Nonlinear Optical Materials, (11 October 1999); https://doi.org/10.1117/12.368293
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Electrodes

Polymers

Gold

Nonlinear optics

Absorption

Microscopy

Polymer thin films

Back to Top