11 October 1999 Nonlinear optical response of Gd2@C80 thin films
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Abstract
Single beam zscan experiments were carried out using a 130 fs tunable Ti:Sapphire-OPA laser system. The size and the sign of the third order susceptibility were measured at 400 nm, 590 nm, 648 nm, 800 nm, and 1000 nm. At 800 measurements were conducted for different pulse durations between 130 fs and 1 ps. Our results show that the measured values of the third order nonlinearity were relatively large, negative, and strongly dependent on pulse duration and wavelength. We found that, when wavelength and pulse duration are taken into account, the third order susceptibility of Gd2 at C80 is about one order of magnitude larger than that of empty-cage C60 or C70.
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Gul Yaglioglu, Robinson Pino, Roger Dorsinville, J. Z. Liu, Ming Yan, "Nonlinear optical response of Gd2@C80 thin films", Proc. SPIE 3796, Organic Nonlinear Optical Materials, (11 October 1999); doi: 10.1117/12.368294; https://doi.org/10.1117/12.368294
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KEYWORDS
Thin films

Absorption

Optical testing

Fullerenes

Picosecond phenomena

Silica

Transmittance

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