Volume holographic wavelet correlators for classification and quality inspection of industry products

Wenyi Feng; Qingsheng He; Yingbai Yan; Guofan Jin; Minxian Wu

doi:10.1117/12.370241

22 November 1999 Volume holographic wavelet correlators for classification and quality inspection of industry products

Wenyi Feng, Qingsheng He, Yingbai Yan, Guofan Jin, Minxian Wu

Proceedings Volume 3802, Advanced Optical Data Storage: Materials, Systems, and Interfaces to Computers; (1999) https://doi.org/10.1117/12.370241
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

Techniques of volume holographic associative storage and wavelet transform are combined to develop a system for classification and quality inspection of industry products. Wavelet transform is introduced to improve the recognition accuracy. The Comparison with the conventional correlation is studied. Multichannel correlation characteristic of the system is adopted to classify products. According to the position of the correlation output with highest intensity, a manipulator can classify the input product. Localization of products is used to solve invariance of the system in application. Variation of the highest correlation intensity is used to inspect quality of products. Curves of each product between correlation intensity and deformed degree are measured in advance. A critical intensity value is setting to judge a product is good in quality or not. In the inspection, the highest correlation output is detected and compared with its own curve. The unqualified product is rejected by the manipulator and the qualified one is accepted and classified. The classification and quality inspection of standard elements are used as an example in our experiment.

Citation Download Citation

Wenyi Feng, Qingsheng He, Yingbai Yan, Guofan Jin, and Minxian Wu "Volume holographic wavelet correlators for classification and quality inspection of industry products", Proc. SPIE 3802, Advanced Optical Data Storage: Materials, Systems, and Interfaces to Computers, (22 November 1999); https://doi.org/10.1117/12.370241

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Inspection

Wavelets

Volume holography

Holography

Crystals

Classification systems

Wavelet transforms

Show All Keywords

Keywords/Phrases

Search In:

Publication Years