PROCEEDINGS VOLUME 3806
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 18-23 JULY 1999
Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks
SPIE'S INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
18-23 July 1999
Denver, CO, United States
Optical Disk Testing Equipment and Testing Methodologies
Proc. SPIE 3806, VERSATEST-I: a versatile polychromatic dynamic testbed for optical disks, 0000 (30 November 1999); doi: 10.1117/12.371150
Proc. SPIE 3806, Immersion microscope for static testing of near-field phase-change optical disks, 0000 (30 November 1999); doi: 10.1117/12.371160
Proc. SPIE 3806, Step-height metrology for data storage applications, 0000 (30 November 1999); doi: 10.1117/12.371161
Proc. SPIE 3806, Accelerated aging studies and the prediction of the archival lifetime of optical disk media, 0000 (30 November 1999); doi: 10.1117/12.371162
Optical Disk Testing Methodologies II and Optical Disk Drive Characterization
Proc. SPIE 3806, Variation in optical disk retardance measurements, 0000 (30 November 1999); doi: 10.1117/12.371163
Proc. SPIE 3806, Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry, 0000 (30 November 1999); doi: 10.1117/12.371164
Proc. SPIE 3806, Grating pitch measurements with the molecular measuring machine, 0000 (30 November 1999); doi: 10.1117/12.371144
Proc. SPIE 3806, Properties of active waveguide of ultrasmall-size laser used in near-field optical recording: characterization and model, 0000 (30 November 1999); doi: 10.1117/12.371145
Proc. SPIE 3806, Wavefront analysis of concentric pupil zones, 0000 (30 November 1999); doi: 10.1117/12.371146
Optical Disk Media Characterization I
Proc. SPIE 3806, Methods to characterize the recording layer of phase-change media initialized by induction heating, 0000 (30 November 1999); doi: 10.1117/12.371147
Proc. SPIE 3806, Methods for characterization of phase change optical disks, 0000 (30 November 1999); doi: 10.1117/12.371148
Proc. SPIE 3806, CD-R and CD-RW optical disk characterization in response to intense light sources, 0000 (30 November 1999); doi: 10.1117/12.371149
Optical Disk Media Characterization II and Standards
Proc. SPIE 3806, Status of international optical disk standards, 0000 (30 November 1999); doi: 10.1117/12.371151
Proc. SPIE 3806, Microscopic image analysis of defect areas in optical disks, 0000 (30 November 1999); doi: 10.1117/12.371152
Proc. SPIE 3806, Characterization of multilayer depositions of DVD-RAM disks, 0000 (30 November 1999); doi: 10.1117/12.371153
Proc. SPIE 3806, Practical relevance of standardized disk and drive measurements, 0000 (30 November 1999); doi: 10.1117/12.371154
Proc. SPIE 3806, Review of the existing standards, literature, test development, test results, and caveats concerning compact disks, 0000 (30 November 1999); doi: 10.1117/12.371155
Proc. SPIE 3806, Communication of CD-R characteristics such as data integrity, media reliability, and life expectancy to application developers and data users, 0000 (30 November 1999); doi: 10.1117/12.371156
Poster Session
Proc. SPIE 3806, Thermal modeling using enthalpy methods to aid in the study of microstructural changes of multilayered phase change optical memories, 0000 (30 November 1999); doi: 10.1117/12.371157
Proc. SPIE 3806, Comparison and analysis on measurement of optical parameters of some semiconductor films by two methods, 0000 (30 November 1999); doi: 10.1117/12.371158
Proc. SPIE 3806, Quality discrimination method for write-once optical disk, 0000 (30 November 1999); doi: 10.1117/12.371159
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