30 November 1999 Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry
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Abstract
New azo dye-doped polymer thin films have been made by spin- coating method on single-crystal silicon substrates. The complex dielectric function and optical parameters of the films have been measured with a fixed angle of incidence automatic spectroscopic ellipsometer. The electronic structure of the films has been explained.
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Guangbin Wang, Lisong Hou, Fuxi Gan, "Characterization of optical parameters of an azo-dye-doped polymer PMMA thin film from spectroscopic ellipsometry", Proc. SPIE 3806, Recent Advances in Metrology, Characterization, and Standards for Optical Digital Data Disks, (30 November 1999); doi: 10.1117/12.371164; https://doi.org/10.1117/12.371164
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