10 June 1999 HgCdTe photodiode performance degradation
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Proceedings Volume 3819, International Conference on Photoelectronics and Night Vision Devices; (1999) https://doi.org/10.1117/12.350885
Event: International Conference on Photoelectronics and Night Vision Devices, 1998, Moscow, Russian Federation
Abstract
Cadmium mercury telluride (MCT) photodiodes stability has been investigated. Possible reasons of photodiodes performances degradation are analyzed. High temporal and thermal stability at storage temperature up to 70 degree(s)C of ion implanted MCT photovoltaic detectors is shown.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. A. Bovina, L. A. Bovina, K. O. Boltar, K. O. Boltar, Vitaly I. Stafeev, Vitaly I. Stafeev, Vladimir M. Lakeenkov, Vladimir M. Lakeenkov, M. A. Loschinina, M. A. Loschinina, } "HgCdTe photodiode performance degradation", Proc. SPIE 3819, International Conference on Photoelectronics and Night Vision Devices, (10 June 1999); doi: 10.1117/12.350885; https://doi.org/10.1117/12.350885
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