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10 June 1999 Sensitive element dimension measurements in focal plane arrays
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Proceedings Volume 3819, International Conference on Photoelectronics and Night Vision Devices; (1999) https://doi.org/10.1117/12.350913
Event: International Conference on Photoelectronics and Night Vision Devices, 1998, Moscow, Russian Federation
Abstract
The method of IR detector sensitivity spatial distribution restoring from the experimentally measured photosignal dependence versus optical spot position and known optical spot spread function is developed and experimentally investigated.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. O. Boltar and N. I. Iakovleva "Sensitive element dimension measurements in focal plane arrays", Proc. SPIE 3819, International Conference on Photoelectronics and Night Vision Devices, (10 June 1999); https://doi.org/10.1117/12.350913
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