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21 September 1999 Analysis of interferometric fringe patterns by optical wavelet transform
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Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364261
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Abstract
For the application of interferometric methods in industrial quality control and particularly in non-destructive material testing an extensive analysis of the obtained image data is needed. In the field of optical image processing wavelet transformation has been proved to be a capable tool in the detection of structures with definite spatial resolution. The selection of the analyzing wavelet function and the variation of parameters lead to a wide range of selective wavelet filters, which are able to perform detection and classification of structures. The presented paper demonstrates numerical simulations and their optical realization in an SLM- based correlator. To locate defect patterns of different classes in interferometric fringe patterns, several wavelet functions, which are optically realizable by a transmission distribution, were utilized. The optical experiments indicate a good accordance with the computer simulations.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sven Krueger, Larbi Bouamama, Hartmut Gruber, Stephan Teiwes, and Guenther K.G. Wernicke "Analysis of interferometric fringe patterns by optical wavelet transform", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); https://doi.org/10.1117/12.364261
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