21 September 1999 One-point-of-view high-precision and versatile optical measurement of different sides of objects
Author Affiliations +
Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364284
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany
Quality checking and part measurement are common needs in confectioning and manufacturing processes especially of electronic components. The complete part inspection of SMD- element, of connectors, of toy buildings blocks are such examples. For all these examples the demand arises to check parameters of different object sides by optical means with extremely high precision. The referred solution performs such inspection tasks from one point of view for (up to) five different sides, whereby four sides must be inspected for coplanarity and for the fifth the imprint quality has to be controlled. The optical set up uses special positioned mirrors combined with a sophisticated lighting system producing back light (coplanarity) as well as direct light (imprint inspection). The measurement procedure contains, of course, a calibration by help of a normal. The high precise measurement, better 10 micrometer, in the acquired image with a relatively low local resolution is reached by a spline based subpixel approach. Introducing cylindrical lenses or parabolic mirrors in the optical way allows to improve the potential accuracy for areas of interest, inside the view available for inspection.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerd Stanke, Gerd Stanke, Dirk Holm, Dirk Holm, Tim Woehrle, Tim Woehrle, } "One-point-of-view high-precision and versatile optical measurement of different sides of objects", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); doi: 10.1117/12.364284; https://doi.org/10.1117/12.364284


Wide field corrector for 4MOST design details and MAIV...
Proceedings of SPIE (August 09 2016)
Rendering for machine vision prototyping
Proceedings of SPIE (September 27 2008)
On-line Optical Gaging
Proceedings of SPIE (May 28 1980)
Effect of ambient light on surface roughness inspection
Proceedings of SPIE (December 31 2008)

Back to Top