Optical frequency domain reflectometer for fiber structural testing

Renat G. Zalyalov; Rishad A. Akhtiamov; Gennady A. Morozov; Oleg G. Morozov; Yuri E. Pol'ski

doi:10.1117/12.364279

21 September 1999 Optical frequency domain reflectometer for fiber structural testing

Renat G. Zalyalov; Rishad A. Akhtiamov; Gennady A. Morozov; Oleg G. Morozov; Yuri E. Pol'ski;

Author Affiliations +

Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364279
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany

Abstract

One of the main ways to develop testing nondestructive devices for fiber communication systems is to use optical reflectometry in frequency domain (OFDR) and LFM-technique. There are some problems in OFDR-systems which are determined by complexity degree of modulation type realization and its law, low energy characteristics of frequency modulators and large scattering losses on reflectometer units in general. In present paper we want to consider some common and special solutions for these problems. Especially a new LFM-technique based on two frequency laser radiation, which can help us to develop compact reflectometer, is presented. Basic consideration of one frequency radiation transformation into two frequency is given. The elements of LFM technique for reflectometers are given. We determined informative parameters of output radiation and their connection with degree of internal and external disturbances and coordinates along the axis of fiber, calculated the accuracy characteristics of system. We showed that two frequency output radiation carried more information and could help us to get results closed to two mode reflectometers. The experimental set-up of structural testing system and first practical results are given.

Citation Download Citation

Renat G. Zalyalov, Rishad A. Akhtiamov, Gennady A. Morozov, Oleg G. Morozov, Yuri E. Pol'ski, "Optical frequency domain reflectometer for fiber structural testing", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); doi: 10.1117/12.364279; https://doi.org/10.1117/12.364279

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